Peter Eaton and Paul West
- Published in print:
- 2010
- Published Online:
- May 2010
- ISBN:
- 9780199570454
- eISBN:
- 9780191722851
- Item type:
- book
- Publisher:
- Oxford University Press
- DOI:
- 10.1093/acprof:oso/9780199570454.001.0001
- Subject:
- Physics, Atomic, Laser, and Optical Physics
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it ...
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Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it also allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and easy to use. Peter Eaton and Paul West share a common passion for atomic force microscopy. However, they have very different perspectives on the technique. Over the past 12 years Peter used AFMs as the focal point of his research in a variety of scientific projects from materials science to biology. Paul, on the other hand, is an instrument builder and has spent the past 25 years creating these microscopes for scientists and engineers. This insightful book covers the theory, practice and applications of atomic force microscopes and will serve as an introduction to AFM for scientists and engineers that want to learn about this powerful technique, and as a reference book for expert AFM users. Application examples from the physical, materials, and life sciences, nanotechnology and industry illustrate the many and varied capabilities of the technique.Less
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it also allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and easy to use. Peter Eaton and Paul West share a common passion for atomic force microscopy. However, they have very different perspectives on the technique. Over the past 12 years Peter used AFMs as the focal point of his research in a variety of scientific projects from materials science to biology. Paul, on the other hand, is an instrument builder and has spent the past 25 years creating these microscopes for scientists and engineers. This insightful book covers the theory, practice and applications of atomic force microscopes and will serve as an introduction to AFM for scientists and engineers that want to learn about this powerful technique, and as a reference book for expert AFM users. Application examples from the physical, materials, and life sciences, nanotechnology and industry illustrate the many and varied capabilities of the technique.
Peter Eaton and Paul West
- Published in print:
- 2010
- Published Online:
- May 2010
- ISBN:
- 9780199570454
- eISBN:
- 9780191722851
- Item type:
- chapter
- Publisher:
- Oxford University Press
- DOI:
- 10.1093/acprof:oso/9780199570454.003.0001
- Subject:
- Physics, Atomic, Laser, and Optical Physics
This chapter covers the background to AFM, placing it in the context of other microscopic techniques. It describes some major highlights of AFM, illustrating the power of the technique. It describes ...
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This chapter covers the background to AFM, placing it in the context of other microscopic techniques. It describes some major highlights of AFM, illustrating the power of the technique. It describes how AFM can be compared to optical and electron microscopy, and where AFM is a more suitable technique, and also where it is not. The AFM was developed as a version of the scanning tunnelling microscope (STM), that would be more capable of imaging biological samples; however AFM is now far more widely used than STM, and the chapter describes the development of AFM and STM, and shows why AFM is more popular for many samples.Less
This chapter covers the background to AFM, placing it in the context of other microscopic techniques. It describes some major highlights of AFM, illustrating the power of the technique. It describes how AFM can be compared to optical and electron microscopy, and where AFM is a more suitable technique, and also where it is not. The AFM was developed as a version of the scanning tunnelling microscope (STM), that would be more capable of imaging biological samples; however AFM is now far more widely used than STM, and the chapter describes the development of AFM and STM, and shows why AFM is more popular for many samples.
Andrew Briggs and Oleg Kolosov
- Published in print:
- 2009
- Published Online:
- February 2010
- ISBN:
- 9780199232734
- eISBN:
- 9780191716355
- Item type:
- book
- Publisher:
- Oxford University Press
- DOI:
- 10.1093/acprof:oso/9780199232734.001.0001
- Subject:
- Physics, Condensed Matter Physics / Materials
Acoustic microscopy enables you to image and measure the elastic properties of materials with the resolution of a good microscope. By using frequencies in the microwave range, it is possible to make ...
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Acoustic microscopy enables you to image and measure the elastic properties of materials with the resolution of a good microscope. By using frequencies in the microwave range, it is possible to make the acoustic wavelength comparable with the wavelength of light, and hence to achieve a resolution comparable with an optical microscope. The contrast gives information about the elastic properties and structure of the sample. Since acoustic waves can propagate in materials, acoustic microscopy can be used for interior imaging, with high sensitivity to defects such as delaminations. Solids can support both longitudinal and transverse acoustic waves. At surfaces a combination of the two known as Rayleigh waves can propagate, and in many circumstances these dominate the contrast in acoustic microscopy. Contrast theory accounts for the variation of signal with defocus, V(z). Acoustic microscopy can image and measure properties such as anisotropy and features such as surface boundaries and cracks. A scanning probe microscope can be used to detect ultrasonic vibration of a surface with resolution in the nanometre range, thus beating the diffraction limit by operating in the extreme near‐field. This 2nd edition of Acoustic Microscopy has a major new chapter on the technique and applications of acoustically exited probe microscopy.Less
Acoustic microscopy enables you to image and measure the elastic properties of materials with the resolution of a good microscope. By using frequencies in the microwave range, it is possible to make the acoustic wavelength comparable with the wavelength of light, and hence to achieve a resolution comparable with an optical microscope. The contrast gives information about the elastic properties and structure of the sample. Since acoustic waves can propagate in materials, acoustic microscopy can be used for interior imaging, with high sensitivity to defects such as delaminations. Solids can support both longitudinal and transverse acoustic waves. At surfaces a combination of the two known as Rayleigh waves can propagate, and in many circumstances these dominate the contrast in acoustic microscopy. Contrast theory accounts for the variation of signal with defocus, V(z). Acoustic microscopy can image and measure properties such as anisotropy and features such as surface boundaries and cracks. A scanning probe microscope can be used to detect ultrasonic vibration of a surface with resolution in the nanometre range, thus beating the diffraction limit by operating in the extreme near‐field. This 2nd edition of Acoustic Microscopy has a major new chapter on the technique and applications of acoustically exited probe microscopy.
Anne Marcovich and Terry Shinn
- Published in print:
- 2014
- Published Online:
- November 2014
- ISBN:
- 9780198714613
- eISBN:
- 9780191782923
- Item type:
- chapter
- Publisher:
- Oxford University Press
- DOI:
- 10.1093/acprof:oso/9780198714613.003.0002
- Subject:
- Physics, History of Physics
Nanoscale scientific research suddenly arose during the 1980s and 1990s. It now constitutes an immense worldwide research domain. It is based on the invention of scanning probe microscopy and ...
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Nanoscale scientific research suddenly arose during the 1980s and 1990s. It now constitutes an immense worldwide research domain. It is based on the invention of scanning probe microscopy and powerful numerical simulation, and on the capacity to manipulate individual molecules and atoms. The capacity of nanoscale research to synthesize artificial substances, often through epitaxy, such as fullerenes and low-dimensional objects, has fueled important transformations in scientific investigation and allowed the formulation of previously unimagined questions. The emergence of nanostructured materials and corresponding instrumentation has been fueled by cognitive, methodological, instrumental, and material combinatorials. “Combinatorial” refers to an association or interlocking of two or more components that give rise to a resulting novelty in the form of a synergy.Less
Nanoscale scientific research suddenly arose during the 1980s and 1990s. It now constitutes an immense worldwide research domain. It is based on the invention of scanning probe microscopy and powerful numerical simulation, and on the capacity to manipulate individual molecules and atoms. The capacity of nanoscale research to synthesize artificial substances, often through epitaxy, such as fullerenes and low-dimensional objects, has fueled important transformations in scientific investigation and allowed the formulation of previously unimagined questions. The emergence of nanostructured materials and corresponding instrumentation has been fueled by cognitive, methodological, instrumental, and material combinatorials. “Combinatorial” refers to an association or interlocking of two or more components that give rise to a resulting novelty in the form of a synergy.
Mark Geoghegan and Georges Hadziioannou
- Published in print:
- 2013
- Published Online:
- December 2013
- ISBN:
- 9780199533824
- eISBN:
- 9780191774997
- Item type:
- chapter
- Publisher:
- Oxford University Press
- DOI:
- 10.1093/acprof:oso/9780199533824.003.0008
- Subject:
- Physics, Condensed Matter Physics / Materials
Polymer devices for electronic applications are generally prepared in thin film form and so the effect of surfaces is of significant interest. This chapter covers the thermodynamics of surfaces; ...
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Polymer devices for electronic applications are generally prepared in thin film form and so the effect of surfaces is of significant interest. This chapter covers the thermodynamics of surfaces; different means of preparing thin films of relevance to polymer electronics; and the measurement of surfaces using scanning probe techniques or photoelectron analysis. In the latter case, the use of surface techniques to obtain information on the electronic properties of the material is discussed.Less
Polymer devices for electronic applications are generally prepared in thin film form and so the effect of surfaces is of significant interest. This chapter covers the thermodynamics of surfaces; different means of preparing thin films of relevance to polymer electronics; and the measurement of surfaces using scanning probe techniques or photoelectron analysis. In the latter case, the use of surface techniques to obtain information on the electronic properties of the material is discussed.
