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Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it also allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and easy to use. Peter Eaton and Paul West share a common passion for atomic force microscopy. However, they have very different perspectives on the technique. Over the past 12 years Peter used AFMs as the focal point of his research in a variety of scientific projects from materials science to biology. Paul, on the other hand, is an instrument builder and has spent the past 25 years creating these microscopes for scientists and engineers. This insightful book covers the theory, practice and applications of atomic force microscopes and will serve as an introduction to AFM for scientists and engineers that want to learn about this powerful technique, and as a reference book for expert AFM users. Application examples from the physical, materials, and life sciences, nanotechnology and industry illustrate the many and varied capabilities of the technique.

Acoustic microscopy enables you to image and measure the elastic properties of materials with the resolution of a good microscope. By using frequencies in the microwave range, it is possible to make the acoustic wavelength comparable with the wavelength of light, and hence to achieve a resolution comparable with an optical microscope. The contrast gives information about the elastic properties and structure of the sample. Since acoustic waves can propagate in materials, acoustic microscopy can be used for interior imaging, with high sensitivity to defects such as delaminations. Solids can support both longitudinal and transverse acoustic waves. At surfaces a combination of the two known as Rayleigh waves can propagate, and in many circumstances these dominate the contrast in acoustic microscopy. Contrast theory accounts for the variation of signal with defocus, V(z). Acoustic microscopy can image and measure properties such as anisotropy and features such as surface boundaries and cracks. A scanning probe microscope can be used to detect ultrasonic vibration of a surface with resolution in the nanometre range, thus beating the diffraction limit by operating in the extreme near‐field. This 2nd edition of Acoustic Microscopy has a major new chapter on the technique and applications of acoustically exited probe microscopy.