Jump to ContentJump to Main Navigation

You are looking at 1-2 of 2 items

  • Keywords: non-contact AFM x
Clear All Modify Search

View:

Atomic Force Microscopy

C. Julian Chen

in Introduction to Scanning Tunneling Microscopy: Second Edition

Published in print:
2007
Published Online:
September 2007
ISBN:
9780199211500
eISBN:
9780191705991
Item type:
chapter
Publisher:
Oxford University Press
DOI:
10.1093/acprof:oso/9780199211500.003.0015
Subject:
Physics, Condensed Matter Physics / Materials

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the ... More


Atomic Force Microscopy

C. Julian Chen

in Introduction to Scanning Tunneling Microscopy

Published in print:
2021
Published Online:
April 2021
ISBN:
9780198856559
eISBN:
9780191889905
Item type:
chapter
Publisher:
Oxford University Press
DOI:
10.1093/oso/9780198856559.003.0016
Subject:
Physics, Condensed Matter Physics / Materials

This chapter discusses atomic force microscopy (AFM), focusing on the methods for atomic force detection. Although the force detection always requires a cantilever, there are two types of modes: the ... More


View: