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AFM image artefacts

Peter Eaton and Paul West

in Atomic Force Microscopy

Published in print:
2010
Published Online:
May 2010
ISBN:
9780199570454
eISBN:
9780191722851
Item type:
chapter
Publisher:
Oxford University Press
DOI:
10.1093/acprof:oso/9780199570454.003.0006
Subject:
Physics, Atomic, Laser, and Optical Physics

AFM, like any other measurement technique, is prone to artefacts. These can arise due to the AFM probe, the scanner, the instrument electronics, from the laboratory environment, or from many outer ... More


SYNCHROTRON X-RAY ABSORPTION TOMOGRAPHY

Astrid Haibel

in Advanced Tomographic Methods in Materials Research and Engineering

Published in print:
2008
Published Online:
May 2008
ISBN:
9780199213245
eISBN:
9780191707582
Item type:
chapter
Publisher:
Oxford University Press
DOI:
10.1093/acprof:oso/9780199213245.003.0005
Subject:
Physics, Condensed Matter Physics / Materials

This chapter discusses the principles of synchrotron X-ray tomography. The technique exploits the different linear attenuation coefficients of the chemical elements present in a sample or, ... More


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