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Scanning Probe Microscopy

Kannan M. Krishnan

in Principles of Materials Characterization and Metrology

Published in print:
2021
Published Online:
July 2021
ISBN:
9780198830252
eISBN:
9780191868665
Item type:
chapter
Publisher:
Oxford University Press
DOI:
10.1093/oso/9780198830252.003.0011
Subject:
Physics, Condensed Matter Physics / Materials

Scanning probe microscopy (SPM) scans a fine tip close to a surface and measures the tunneling current (STM) or force (SFM), based on many possible tip-surface interactions. STM provides atomic ... More


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